chrisshaffer / wafer-defect-mapsLinks
Inspection equipment for the semiconductor industry saves companies millions of dollars. This project uses the MIR-WM811K Corpus» of wafer maps to build a CNN classifier to automate classification of wafer defect patterns.
☆31Updated 3 years ago
Alternatives and similar repositories for wafer-defect-maps
Users that are interested in wafer-defect-maps are comparing it to the libraries listed below
Sorting:
- We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.☆31Updated last year
- ☆99Updated 5 months ago
- The proposed idea is to use convolutional neural network (CNN) to classify defects on the semiconductor wafer substrate. There are total …☆18Updated 4 years ago
- ☆42Updated 2 years ago
- 本项目用深度学习的方法进行工业产品缺陷检测，替代原本人眼的产品质检。从而大幅提升工业产品合格率和降低人力成本。☆149Updated 5 years ago
- This project aims to automatically detect surface defects in Hot-Rolled Steel Strips such as rolled-in scale, patches, crazing, pitted su…☆54Updated 4 years ago
- Lithography defect prediction for microchip manufacturing optimization with machine learning model☆23Updated last year
- About KLARF file convert to wafer defect scan map in Semiconductor trade.☆17Updated 3 years ago
- LF-YOLO (Lighter and Faster YOLO) is used to detect defect of X-ray weld image.☆60Updated 10 months ago
- semiconductor wafer pattern map classified from web data sets WM-811K☆38Updated 2 years ago
- Classify WM-811K wafer map for error type☆20Updated 6 years ago
- Shot & Wafer map for semiconductor☆63Updated 10 months ago
- This is a deep learning application project in the industrial field, intended to detect defects on the workpiece surface. The code is bas…☆82Updated 5 years ago
- This repo contains data pre-processing, classification and defect detection methodologies for images from Advance XRay Inspection from mu…☆55Updated 3 years ago
- 钢铁缺陷检测☆12Updated 4 years ago
- Analyzed real-world foundry data and built a classifier to detect semiconductor wafer defects during the manufacturing process.☆18Updated 7 years ago
- 图像处理、机器学习的常用算法汇总☆57Updated 2 years ago
- 无监督正样本训练 检测缺陷并分割图像☆26Updated 3 years ago
- One-Shot Recognition of Manufacturing Defects in Steel Surfaces☆41Updated 4 years ago
- A synthetic PCB dataset☆43Updated 2 years ago
- Image segmentation☆19Updated 4 years ago
- This project is about detecting defects on steel surface using Unet. The dataset used for this project is the NEU-DET database.☆113Updated 4 years ago
- Defect-GLM：A Large Visual-Language Model for Industrial Defect Monitoring|首个用于工业缺陷监测的开源大规模视觉语言模型☆81Updated 9 months ago
- Increased yield of semiconductor wafer maps through classification of defective types of semiconductor wafer maps☆10Updated 3 years ago
- Deep Learning Based Steel Pipe Weld Defect Detection☆87Updated 3 years ago
- This is the GC10-DET datasets of the upcoming paper " Deep Metallic Surface Defect Detection: the New Benchmark and Detection Network" Th…☆66Updated 3 years ago
- 机器视觉缺陷检测☆24Updated 2 years ago
- Lightweight Rail Surface Defect Detection Algorithm Based on an Improved YOLOv8☆28Updated 4 months ago
- 首先这是一个博主的代码，博主：https://space.bilibili.com/18161609/channel/detail?cid=113611&ctype=0。本人基于学习之余对改代码进行修改，利用该代码对天池重庆工业酒瓶缺陷检测。☆7Updated 4 years ago
- 基于YOLOv7的芯片表面缺陷检测系统（源码＆教程）☆50Updated last year