chrisshaffer / wafer-defect-maps
View external linksLinks

Inspection equipment for the semiconductor industry saves companies millions of dollars. This project uses the MIR-WM811K Corpus» of wafer maps to build a CNN classifier to automate classification of wafer defect patterns.
37Aug 16, 2021Updated 4 years ago

Alternatives and similar repositories for wafer-defect-maps

Users that are interested in wafer-defect-maps are comparing it to the libraries listed below

Sorting:

Are these results useful?