pohwa065 / Surface-Defect-Image-Classification-with-Convolutional-Neural-Network
The proposed idea is to use convolutional neural network (CNN) to classify defects on the semiconductor wafer substrate. There are total 7 classes to be classified. Data augmentation by Generative Adversarial Network (GAN) is applied on 2 of the classes to improve classification accuracy.
☆18Updated 4 years ago
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