Junliangwangdhu / WaferMap
☆84Updated last month
Alternatives and similar repositories for WaferMap:
Users that are interested in WaferMap are comparing it to the libraries listed below
- ☆41Updated last year
- semiconductor wafer pattern map classified from web data sets WM-811K☆35Updated last year
- Wafer map pattern classification using stacking ensemble with TF2 Keras☆10Updated 3 years ago
- Original PyTorch implementation of the paper 'Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification'☆19Updated 4 years ago
- A PCB defect dataset.☆372Updated 6 years ago
- Defect-GLM：A Large Visual-Language Model for Industrial Defect Monitoring|首个用于工业缺陷监测的开源大规模视觉语言模型☆70Updated 5 months ago
- Dataset for classification, detection and prognostics of surface defects on ball screw drives☆57Updated 3 years ago
- Unofficial re-implementation of MemSeg for Anomaly Detection☆188Updated 7 months ago
- This project is about detecting defects on steel surface using Unet. The dataset used for this project is the NEU-DET database.☆102Updated 3 years ago
- ☆23Updated 4 years ago
- Unofficial implementation of Google "CutPaste: Self-Supervised Learning for Anomaly Detection and Localization" in PyTorch☆115Updated 2 years ago
- A dataset of functional and defective solar cells extracted from EL images of solar modules☆250Updated 4 months ago
- This is the implementation of Semi-supervised Anomaly Detection using AutoEncoders☆62Updated 4 years ago
- This is the GC10-DET datasets of the upcoming paper " Deep Metallic Surface Defect Detection: the New Benchmark and Detection Network" Th…☆63Updated 2 years ago
- Photovoltaic cell defect detection☆91Updated 2 months ago
- Improving Unsupervised Defect Segmentation by Applying Structural Similarity to Autoencoders☆125Updated 4 years ago
- [IEEE TIM] An Incremental Knowledge Learning Framework for Continuous Defect Detection☆20Updated 9 months ago
- Inspection equipment for the semiconductor industry saves companies millions of dollars. This project uses the MIR-WM811K Corpus» of wafe…☆27Updated 3 years ago
- ☆478Updated 6 months ago
- 本项目实现了一种基于 VAE-CycleGAN 的图像重建无监督缺陷检测算法。该算法结合了变分自编码器 (VAE) 和 CycleGAN 的优势，无需标注数据即可检测图像中的缺陷/异常。This project implements an unsupervised defe…☆45Updated 2 months ago
- Pytorch implementation of "Unsupervised Anomaly Detection with Generative Adversarial Networks to Guide Marker Discovery"☆61Updated 4 years ago
- The proposed idea is to use convolutional neural network (CNN) to classify defects on the semiconductor wafer substrate. There are total …☆18Updated 4 years ago
- Unsupervised classification of the North Eastern University Steel Surface Defects Database☆29Updated 2 years ago
- ☆75Updated last year
- Unofficial pytorch implementation of Student-Teacher Feature Pyramid Matching for Unsupervised Anomaly Detection☆79Updated 3 years ago
- Classify WM-811K wafer map for error type☆19Updated 6 years ago
- Official PyTorch implementation for "Mixed supervision for surface-defect detection: from weakly to fully supervised learning"☆300Updated 2 years ago
- Deep Learning Based Steel Pipe Weld Defect Detection☆79Updated 3 years ago
- LF-YOLO (Lighter and Faster YOLO) is used to detect defect of X-ray weld image.☆54Updated 6 months ago
- A synthetic PCB dataset☆42Updated last year